this post was submitted on 06 Dec 2024
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Talking about the "yield" of a process doesn't make any sense. Yield is a metric for a specific chip fabricated on a given process. This depends heavily on the size of the chip and mitigation techniques.
The "correct" metric to compare processes is defect density (in defects per square cm). Intel claims that their defect density is below 0.4 defects/cm²: https://www.tomshardware.com/tech-industry/intel-says-defect-density-at-18a-is-healthy-potential-clients-are-lining-up. This would be relatively high but not much worse than what TSMC has seen for their recent nodes: https://www.techpowerup.com/forums/threads/intel-18a-process-node-clocks-an-abysmal-10-yield-report.329513/page-2#post-5387835).